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1. [Amps] Re: IM Distortion (score: 1): Author: G3SEK at ifwtech.co.uk (Ian White, G3SEK); Date: Wed Mar 5 11:29:32 2003; wrote: I don't think that the frequencies alone is enough. You'd also have to vary the amplitudes at each frequency... and then the test protocol starts to become messy. The other point that hasn't b; /archives//html/Amps/2003-03/msg00184.html (10,022 bytes)
2. [Amps] Re: IM Distortion (score: 1): Author: RFlabnotes at aol.com (RFlabnotes@aol.com); Date: Wed Mar 5 13:15:18 2003; Ian: I totally agree with everything you say, especially the technical issues. As I have preached many times, the real problem(s) appear when we attempt to reduce complex technical phenomena to one-l; /archives//html/Amps/2003-03/msg00196.html (12,600 bytes)
3. [Amps] Re: IM Distortion (score: 1): Author: G3SEK at ifwtech.co.uk (Ian White, G3SEK); Date: Wed Mar 5 16:02:45 2003; Yes, I believe that too. As you predicted, we seem to be talking about two different things. If I have understood you correctly, you are looking for a way of testing only the active device (tube, MOS; /archives//html/Amps/2003-03/msg00206.html (11,681 bytes)
4. [Amps] Re: IM Distortion (score: 1): Author: RFlabnotes at aol.com (RFlabnotes@aol.com); Date: Thu Mar 6 08:25:22 2003; Ian: There are a few very technical points to consider here (that actually do affect the relavence of all of this) and I think it best we discuss it offline. If we come to any earth-shaking conclusio; /archives//html/Amps/2003-03/msg00253.html (8,761 bytes)

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